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Algorithm and a method for characterizing surfaces with fractal nature

Patent image
NRL

A computer implemented method for directly determining parameters defining a Weierstrass-Mandelbrot (W-M) analytical representation of a rough surface scalar field with fractal character, embedded in a three dimensional space, utilizing pre-existing measured elevation data of a rough surface in the form of a discrete collection of data describing a scalar field at distinct spatial coordinates, is carried out by applying an inverse algorithm to the elevation data to thereby determine the parameters that define the analytical and continuous W-M representation of the rough surface. The invention provides a comprehensive approach for identifying all parameters of the W-M function including the phases and the density of the frequencies that must greater than 1. This enables the infinite-resolution analytical representation of any surface or density array through the W-M fractal function.

Inventors: 
Michopoulos, John G.; Iliopoulos, Athanasios
Patent Number: 
Technical domain: 
IT and Software
FIle Date: 
2012-08-10
Grant Date: 
2014-11-11
Grant time: 
823 days
Grant time percentile rank: 
15
Claim count percentile rank: 
3
Citations percentile rank: 
1
'Cited by' percentile rank: 
1
Assignee: 
US NAVY