Maryland's Defense Patent Database

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Method of producing epitaxial layers with low basal plane dislocation concentrations

Patent image
NRL

A method of: flowing a silicon source gas, a carbon source gas, and a carrier gas into a growth chamber under growth conditions to epitaxial grow silicon carbide on a wafer in the growth chamber; stopping or reducing the flow of the silicon source gas to interrupt the silicon carbide growth and maintaining the flow of the carrier gas while maintaining an elevated temperature in the growth chamber for a period of time; and resuming the flow of the silicon source gas to reinitiate silicon carbide growth. The wafer remains in the growth chamber throughout the method.

Inventors: 
Stahlbush, Robert E.; Vanmil, Brenda L.; Lew, Kok-keong; Myers-ward, Rachael L.; Gaskill, David Kurt; Eddy Jr., Charles R.
Patent Number: 
Technical domain: 
Materials and Coatings
FIle Date: 
2008-10-09
Grant Date: 
2014-02-18
Grant time: 
1,958 days
Grant time percentile rank: 
36
Claim count percentile rank: 
5
Citations percentile rank: 
1
'Cited by' percentile rank: 
1
Assignee: 
US NAVY