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Time continuous ion-ion plasma

Patent image
NRL

An ion-ion plasma source, that features a processing chamber containing a large concentration of halogen or halogen-based gases. A second chamber is coupled to the processing chamber and features an electron source which produces a high energy electron beam. The high energy electron beam is injected into the processing chamber where it is shaped and confined by a means for shaping and confining the high energy electron beam. The high energy electron beam produced in the second chamber when injected into the processing chamber ionizes the halogen gas creating a dense, ion-ion plasma in the processing chamber that is continuous in time.

Inventors: 
Walton, Scott G.; Meger, Robert; Fernsler, Richard; Leenhardt, Darrin
Patent Number: 
Technical domain: 
Electronics and Energy
FIle Date: 
2005-09-20
Grant Date: 
2009-03-31
Grant time: 
1,288 days
Grant time percentile rank: 
23
Claim count percentile rank: 
6
Citations percentile rank: 
3
'Cited by' percentile rank: 
1
Assignee: 
US NAVY